The structural X-ray analysis permits a deep insight into the three-dimensional structures of molecules and their complexes, as well as the exact positioning of each atom. The DITF utilize a wide-angle and narrow-angle X-ray diffractometer for analysis.
Wide-angle X-ray diffractometer
- Two theta angle measurable up to 120°
- Curved imaging plate with 210° aperture
- Elimination of dark current noise permits long exposures
- Dual photomultiplier produces a wide dynamic range
- High sensitivity in combination with low readout noise
- Vast experimental flexibility from powders to ice crystals
Application
- Structure elucidation of various materials (polymers, ceramics, carbons)
- Determination of structure parameters (dimensions of the crystalline unit cell, crystal size, crystallinity, as well as orientation)
Narrow-angle X-ray diffractometer
- Two-dimensional Kratky camera system
- Photodiode-beam-stop to measure intensity and sample absorption correction
- Two-dimensional Kratky collimation considers the measurements of low q-values without system realignment
Application
- Information on larger structural units like crystallite agglomerates, lamellae, pore and particle size, as well as cluster
- Determination of pore and fibrillar structures