Equipment features light and scanning electron microscopy

DITF utilize a broad spectrum of light and scanning electron microscopy to magnify and illustrate the smallest structures of polymers, fibers, and threads. We also have a long-standing experience using a variety of microscopy techniques.

FE-scanning electron microscopy with FIB

Geräteausstattung Licht- und Rasterelektronenmikroskopie des Deutsche Institute für Textil- und Faserforschung- ZEISS Auriga
ZEISS Auriga

high-resolution Field Emission REM with

  • FIB (Focused Ion Beam) – for cutting the samples via the ion beam
  • EDX detector – for micro area analysis
  • Different detectors (Inlens, Everhardt-Thornley, 4- quadrant BSE, ESB, STEM) for ideal imaging
  • Charge Compensation – to reduce charging of non-conductive samples

Sputtering and vaporization facilities

Geräteausstattung Licht- und Rasterelektronenmikroskopie des Deutsche Institute für Textil- und Faserforschung- Hochleistungssputter von QT
High-performance sputter by QT

to create a conductive surface coating. Reproducible layer depth. Option to coat with platinum-palladium, carbon, chrome, gold-palladium, and gold

Universal research microscope

Geräteausstattung Licht- und Rasterelektronenmikroskopie des Deutsche Institute für Textil- und Faserforschung- Zeiss Axioplan
Zeiss Axioplan

with facilities for:

  • Phase contrast
  • Differential interference contrast
  • Polarization
  • Incident light fluorescence

Incident light microscope

Geräteausstattung Licht- und Rasterelektronenmikroskopie des Deutsche Institute für Textil- und Faserforschung- Zeiss Axioskop
Zeiss Axioskop

for the study of materialographic bevels. Contrast methods, brightfield, darkfield, and differential interference contrast.

Material scientific stereomicroscope

Geräteausstattung Licht- und Rasterelektronenmikroskopie des Deutsche Institute für Textil- und Faserforschung- Zeiss Stereomikroskop Discovery V12
Zeiss Stereomicroscope Discovery V12

for the characterization of three-dimensional structures. Significant magnification abilities. Chromatic level-adjusted objectives. Macroscope function (permits images with extended depth focus). Extensive lighting options. Motor control.

Polarizing microscope

Geräteausstattung Licht- und Rasterelektronenmikroskopie des Deutsche Institute für Textil- und Faserforschung- Leitz Laborlux 12Pol Polarisationsmikroskop
Leitz Laborlux 12Pol Polarizing microscope

for the polarization of orthoscopic measurements (e.g., double refraction measurement on fibers) and conoscopy (position of the optical axis). A wide range of compensators.

High-resolution microscope camera

Geräteausstattung Licht- und Rasterelektronenmikroskopie des Deutsche Institute für Textil- und Faserforschung- Zeiss AxioCam MRc5 Mikroskopcamera
Zeiss AxioCam MRc5 Microscopecamera

with a universal adapter for all microscopes. Peltier cooled sensor for low-noise images in poor lighting conditions.

 

Confocal Raman microscope

Geräteausstattung Licht- und Rasterelektronenmikroskopie des Deutsche Institute für Textil- und Faserforschung- Witec Ramanmikroskop
Witec Ramanmicroscope

for material characterization. Differentiation between plastics, carbon fibers, liquids, and so forth. Structural analysis of fiber surfaces as well as cross-sections.